Compartir
Mitigating Process Variability and Soft Errors at Circuit-Level for Finfets (en Inglés)
Alexandra Zimpeck
(Autor)
·
Cristina Meinhardt
(Autor)
·
Laurent Artola
(Autor)
·
Springer
· Tapa Blanda
Mitigating Process Variability and Soft Errors at Circuit-Level for Finfets (en Inglés) - Zimpeck, Alexandra ; Meinhardt, Cristina ; Artola, Laurent
$ 349.172
$ 698.344
Ahorras: $ 349.172
Elige la lista en la que quieres agregar tu producto o crea una nueva lista
✓ Producto agregado correctamente a la lista de deseos.
Ir a Mis Listas
Origen: Estados Unidos
(Costos de importación incluídos en el precio)
Se enviará desde nuestra bodega entre el
Lunes 01 de Julio y el
Lunes 15 de Julio.
Lo recibirás en cualquier lugar de Colombia entre 1 y 5 días hábiles luego del envío.
Reseña del libro "Mitigating Process Variability and Soft Errors at Circuit-Level for Finfets (en Inglés)"
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regardingthe area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.
