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Rf and Microwave Measurements: Device Characterization, Signal Integrity and Spectrum Analysis (en Inglés)
Andrea Mariscotti
(Autor)
·
ASTM Analysis, Simulation, Test and Measureme
· Tapa Blanda
Rf and Microwave Measurements: Device Characterization, Signal Integrity and Spectrum Analysis (en Inglés) - Mariscotti, Andrea
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Origen: Estados Unidos
(Costos de importación incluídos en el precio)
Se enviará desde nuestra bodega entre el
Viernes 24 de Mayo y el
Viernes 07 de Junio.
Lo recibirás en cualquier lugar de Colombia entre 1 y 5 días hábiles luego del envío.
Reseña del libro "Rf and Microwave Measurements: Device Characterization, Signal Integrity and Spectrum Analysis (en Inglés)"
RF and microwave measurements are common to many disciplines and engineering areas: device and PCB characterization and testing, EMI and EMC, and signal integrity, during design, prototyping and production phases. Measurement setups and procedures are more and more complex and demanding in terms of accuracy, performance, flexibility. Methods and techniques are often borrowed from other domains, including signal processing and probability theory. Mastering the whole process has thus become challenging for the variety and breadth of the required skills and experience. This book attacks the problem from two sides: reviewing circuits and transmission lines, signal analysis, random processes and statistics, and then considering the main experimental setup elements (cables, connectors and PCBs). Two chapters are for the Spectrum Analyzer and the Vector Network Analyzer, their settings, operation, calibration and verification. The objective is supporting R&D and test engineers, academic staff and students: references were thoroughly examined and practical examples conceived to support theory and allow autonomous repetition and verification.
