Name: Advances in X-Ray Analysis: Volume 36 (en Inglés)
Price: 177220.00 COP
Availability: InStock
Author: Gilfrich, John V. ; Huang, Ting C. ; Hubbard, C. R.
ISBN: 9781461362937

portada Advances in X-Ray Analysis: Volume 36 (en Inglés)

Advances in X-Ray Analysis: Volume 36 (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

Gilfrich, John V. ; Huang, Ting C. ; Hubbard, C. R.

Idioma

Inglés

N° páginas

685

Encuadernación

Tapa Blanda

Dimensiones

25.4 x 17.8 x 3.6 cm

Peso

1.21 kg.

ISBN13

9781461362937

Categorías

Química analítica
Ciencia de materiales
Ingeniería eléctrica

Advances in X-Ray Analysis: Volume 36 (en Inglés)

Gilfrich, John V. ; Huang, Ting C. ; Hubbard, C. R. (Autor) · Springer · Tapa Blanda

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Reseña del libro "Advances in X-Ray Analysis: Volume 36 (en Inglés)"

The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these "leading-edge" developments, the topic for the Plenary Session was "Grazing-Incidence X- Ray Characterization of Materials. " The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K., opened the session with a lecture on "Grazing Incidence X-Ray Scattering from Thin Films. " He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on "Grazing Incidence Diffuse X-Ray Scattering from Thin Films. " He concentrated on the use of newly developed "off-specular" reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.