Name: Risk Topography: Systemic Risk and Macro Modeling (National Bureau of Economic Research Conference Report) (en Inglés)
SKU: 62053828
Price: 456441.00 COP
Availability: InStock
Author: Brunnermeier Markus,Krishnamurthy Arvind
ISBN: 9780226077734

portada Risk Topography: Systemic Risk and Macro Modeling (National Bureau of Economic Research Conference Report) (en Inglés)

Risk Topography: Systemic Risk and Macro Modeling (National Bureau of Economic Research Conference Report) (en Inglés)

Formato

Libro Físico

Editorial

University Of Chicago Press

Autor

Brunnermeier Markus,Krishnamurthy Arvind

Idioma

Inglés

N° páginas

288

Encuadernación

Tapa Dura

ISBN13

9780226077734

Risk Topography: Systemic Risk and Macro Modeling (National Bureau of Economic Research Conference Report) (en Inglés)

Brunnermeier Markus,Krishnamurthy Arvind (Autor) · University Of Chicago Press · Tapa Dura

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Reseña del libro "Risk Topography: Systemic Risk and Macro Modeling (National Bureau of Economic Research Conference Report) (en Inglés)"

The recent financial crisis and the difficulty of using mainstream macroeconomic models to accurately monitor and assess systemic risk have stimulated new analyses of how we measure economic activity and the development of more sophisticated models in which the financial sector plays a greater role. Markus Brunnermeier and Arvind Krishnamurthy have assembled contributions from leading academic researchers, central bankers, and other financial-market experts to explore the possibilities for advancing macroeconomic modeling in order to achieve more accurate economic measurement. Essays in this volume focus on the development of models capable of highlighting the vulnerabilities that leave the economy susceptible to adverse feedback loops and liquidity spirals. While these types of vulnerabilities have often been identified, they have not been consistently measured. In a financial world of increasing complexity and uncertainty, this volume is an invaluable resource for policymakers working to improve current measurement systems and for academics concerned with conceptualizing effective measurement.