Name: Vlsi-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2 (en Inglés)
SKU: 58537117
Price: 153455.00 COP
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Author: Shin, Youngsoo ; Tsui, Chi Ying ; Kim, Jae-Joon

portada Vlsi-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2 (en Inglés)

Vlsi-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2 (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

Shin, Youngsoo ; Tsui, Chi Ying ; Kim, Jae-Joon

Idioma

Inglés

N° páginas

223

Encuadernación

Tapa Blanda

Dimensiones

23.4x15.6x1.3 cm

Peso

0.34 kg.

ISBN13

9783319834405

Categorías

Manufactura asistida por ordenador (cam)
Diseño asistido por ordenador (cad)
Hardware (o soporte físico del ordenador)
Redes y comunicaciones informáticas

Vlsi-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2 (en Inglés)

Shin, Youngsoo ; Tsui, Chi Ying ; Kim, Jae-Joon (Autor) · Springer · Tapa Blanda

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Reseña del libro "Vlsi-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2 (en Inglés)"

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.